by
stevel » Sat Oct 20, 2007 4:05 am
If you go to the Specify Report page of the method, one of the report formats is "Performance plus Noise". After you choose that format, you can edit your method again. There will be a new page in the method that will allow you to choose your noise window(s).
ChemStation calculates noise 3 different ways. The first is 6*SD. For this one, the window that you choose should consist of perfectly flat baseline. Any one-time bumps or baseline drift will be calculated as noise. This method will always give you the highest noise signal, or lowest s/n. It is also the one that ChemStation uses to print its s/n values.
The 2nd method is peak-to-peak. Just like it says, The calculated noise signal is just the difference between the highest point and the lowest point in your chosen window. The same limitations as 6*SD apply so you want to be very picky about your window that you choose.
The 3rd type is the most realistic as far as I'm concerned. The ASTM method breaks the chosen window into 0.1 min intervals and calculates the noise over each. Baseline drift does not present a problem for this calculation so you options for choosing the window are greater. This one will always give the lowest noise level, or the highest s/n. The window must be at least 1.1 min wide for this method to work, though.