by
Tony » Fri Jun 08, 2007 9:48 am
Mark and Bruce,
Thanks for your suggestions. I'm guessing I could use the area/height approximation for 50% peak width estimation, and perhaps multiply it by a sigma value to estimate width at 5 or 10% height. These derived values could then be used to calculate N and R - however, not tailing, as sigma x area/height derives a total width only and not start and end points?
As far as I can see, N and R calculations are very dependent on the peak width values used (at a certain % above baseline). If I use the baseline width, I get terrible resolution and N estimates, as the peaks tail moderately (and hence have a large baseline width value). Standard calculations require width at 50% for R and 5% or 10% for N; what I was really after were "recognised" calculation methods for R and N that use baseline width. I guess these don't exist? I can use the baseline values anyway for our own internal QC monitoring of the method, where I am just monitoring N and R long-term from run to run. I can process several thousand runs we have already done using area/height derived width and peak end - peak start baseline widths to test how the different methods work.
One final question - how relevant is the R calculation if detection is by MS, especially of an extracted ion, rather than UV? i.e. R may be calculated between two peaks from the UV or TIC trace to determine chormatographic resolution; however, if extracted ion values are used from MS data, there may be no overlap at all between traces. So is R still a useful parameter to evaluate in this case? A bit of a philosophical question....
cheers
Tony