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- Posts: 16
- Joined: Mon Oct 08, 2012 2:44 pm
Hello friends,
Unfortunately, I'm encountering another MS problem.
I've done a checking to my system but it failed, as following:
System Test: Started.
Basic Hardware Test: Passed.
Vacuum System Test: Passed.
RF System Test: Passed.
Waveform System Test: Passed.
Heating System Test: Passed.
Internal Ionization System Test: Failed.
Test Name: Int Ion Step Number: 5 Failure Code: 3 Cause Code: 1
FILAMENT 1 IS NOT WORKING CORRECTLY AT LOW CI BIAS VOLTAGES (-9.5 V), BUT IS WORKING
CORRECTLY AT HIGHER EI BIAS VOLTAGES (-11.5 V). LIKELY CAUSES INCLUDE:
1) THE FILAMENT ASSEMBLY IS DEFECTIVE (DISTORTED OR CONTAMINATED) OR
2) THE SOURCE BLOCK NEEDS TO BE CLEANED OR
3) THE LOWER MANIFOLD BOARD IS DEFECTIVE.
Test Name: Int Ion Step Number: 7 Failure Code: 3 Cause Code: 1
FILAMENT 2 IS NOT WORKING CORRECTLY AT LOW CI BIAS VOLTAGES (-9.5 V), BUT IS WORKING
CORRECTLY AT HIGHER EI BIAS VOLTAGES (-11.5 V). LIKELY CAUSES INCLUDE:
1) THE FILAMENT ASSEMBLY IS DEFECTIVE (DISTORTED OR CONTAMINATED) OR
2) THE SOURCE BLOCK NEEDS TO BE CLEANED OR
3) THE LOWER MANIFOLD BOARD IS DEFECTIVE.
External Ionization System Test: Not Tested.
Acquision System Test: Passed.
Mode Identification System Test: Passed.
EFC System Test: Passed.
System Test: Failed.
System Test: Completed.
So, in the past it has happened to me and the service changed the filament because it was burned. Recently (2 weeks ago) the filament was changed again. Also, the trap assembly was cleaned in the same time. Last week, I had to turn off the instrument so when I started it, error.
I really don't think that the filament is the problem now, but don't understand why isn't it working at low bias?
Wish you all a productive week!
Mermeth
Unfortunately, I'm encountering another MS problem.
I've done a checking to my system but it failed, as following:
System Test: Started.
Basic Hardware Test: Passed.
Vacuum System Test: Passed.
RF System Test: Passed.
Waveform System Test: Passed.
Heating System Test: Passed.
Internal Ionization System Test: Failed.
Test Name: Int Ion Step Number: 5 Failure Code: 3 Cause Code: 1
FILAMENT 1 IS NOT WORKING CORRECTLY AT LOW CI BIAS VOLTAGES (-9.5 V), BUT IS WORKING
CORRECTLY AT HIGHER EI BIAS VOLTAGES (-11.5 V). LIKELY CAUSES INCLUDE:
1) THE FILAMENT ASSEMBLY IS DEFECTIVE (DISTORTED OR CONTAMINATED) OR
2) THE SOURCE BLOCK NEEDS TO BE CLEANED OR
3) THE LOWER MANIFOLD BOARD IS DEFECTIVE.
Test Name: Int Ion Step Number: 7 Failure Code: 3 Cause Code: 1
FILAMENT 2 IS NOT WORKING CORRECTLY AT LOW CI BIAS VOLTAGES (-9.5 V), BUT IS WORKING
CORRECTLY AT HIGHER EI BIAS VOLTAGES (-11.5 V). LIKELY CAUSES INCLUDE:
1) THE FILAMENT ASSEMBLY IS DEFECTIVE (DISTORTED OR CONTAMINATED) OR
2) THE SOURCE BLOCK NEEDS TO BE CLEANED OR
3) THE LOWER MANIFOLD BOARD IS DEFECTIVE.
External Ionization System Test: Not Tested.
Acquision System Test: Passed.
Mode Identification System Test: Passed.
EFC System Test: Passed.
System Test: Failed.
System Test: Completed.
So, in the past it has happened to me and the service changed the filament because it was burned. Recently (2 weeks ago) the filament was changed again. Also, the trap assembly was cleaned in the same time. Last week, I had to turn off the instrument so when I started it, error.
I really don't think that the filament is the problem now, but don't understand why isn't it working at low bias?
Wish you all a productive week!
Mermeth
Mermeth
