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- Posts: 6
- Joined: Tue Sep 29, 2009 9:07 pm
We have been having problems with our Agilent GC/MS in both NCI and EI, but only in SIM mode.
We first noticed this after injecting a 1 pg standard, but now that we look back, we have been having this problem in SIM mode for quite some time. The baseline sits at 0 with random fluctuations, which look as if they are just electronic noise. We are still getting peaks. This is more of a problem in some SIM windows than others. For example, a SIM window containing 6 ions (dwell time = 100 msec, so 1.6 cycles per second) looks terrible. Each SIM window is set up so that the cycles per second is more than 1.5.
Agilent thought the problem was with our sensitivity, however increasing the EMVolts has no effect on the baseline. And since we have had this problem so long and the fullscan baseline looks fine, we have ruled out problems with our consumables. We are also experiencing the problem with 2 different columns and different instrumental methods.
I have also been looking at some pine needle samples that have been run in SIM mode. These have a normal baseline, well at least a baseline that looks normal to my eyes. I'm continuing to look back at more of our runs from the last year.
We have also compared our 1 pg standard to a similar 1 pg standard run on another GC/MS in SIM mode - the other GC/MS has a normal looking baseline.
Any ideas??? I will try to work out how to post a chromatogram so I can show you guys
Thanks
Karen
