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syx » Fri Apr 15, 2005 1:43 am
Based on Funk et al (1992) Qualitatsschirung in der Analytische Cemie, pp. 5 - 39, other parameters should be determined are mean of residual deviation from regression line (Sy), function of st dev (vervahrensstandarabweichung, Sxo) and coeff variation of function (verfahrenvariationkoeffizient, Vxo) ... hope I translate them correctly ...
Sy= sqroot((sum(Yi-Y)^2)/N-2)
for Yi = a + bXi
Sxo=Sy/b
Vxo=100%.Sxo/X
The homogeneity of linearity curve should be proven with to run analysis to 10 samples on highest (N) and lowest concentration (I) from the linearity range, and then PW value is calculated using formula:
Pw=SN^2/SI^2
for SI^2=(sum(Yi-Y)^2)/N-1)
PW value should be lower than F table (f1=N-1; f2=N-1).
A linearity/calibration curve can be used for quantitative concentration analysis only if it is statistically proven that lowest concentration (xI) is significantly different to 0 value. For this reason, it is necessary to prove that Xp value should be less than xI. Xp value can be calculated with formula … I consider not to write the formula here, it is too complex

.
Is this method used widely now?