by
lmh » Thu Nov 05, 2009 2:00 pm
(1) HWMueller, yup, I didn't express myself too clearly, and I suspect you know the subject vastly better than I ever will, so this is very much merely an opinion:
What I meant by different software packages handling noise worse/better is that given a noisy baseline, some software finds quite good starting and stopping points for a peak, and draws quite a realistic baseline somewhere half-way up the noise pattern. Other software draws a baseline from some random low spike before the peak to a random spike after the peak, thereby increasing the peak area. Both packages would do fine on smoothed data, but one does badly on real, unsmoothed data, and its badness would translate to errors at the low end of the calibration curve.
I'm also not against electronic smoothing in the detector. In fact I'm a big fan of smoothing (because it really, really helps the integrator!). The way I see it, smoothing is a good thing, but is always a compromise, because you don't want to smooth away the chromatographic peaks! A detector with lots of smoothing isn't more sensitive, but it will make it easier for you to see peaks, at the expense of not being suitable for measuring very narrow peaks (uplc, CE). Smoothing is a matter of understanding that noise peaks are very narrow (very high frequency), while chromatography peaks are broad and gently-curved (low frequency), and the smoothing has to sit somewhere appropriate, in the middle.
What I meant, when I said that electronic smoothing doesn't necessarily increase the sensitivity of the detector, is that in some cases at least, the same detector with less electronic smoothing would have given the same results given a bit of software smoothing afterwards. Think scintillation detector for radioactive samples: the number of decays per second is a statistical matter, and if I count individual seconds in the detector and smooth 5 points, it's not dissimilar to counting 5 seconds in the detector.
(2) Danko, sort of related to your baseline comments: I've seen ion trap SRM chromatograms where most points are zero (probably determined by threshold at which instruments saves data). In a data-set like this, N is so badly measured that S/N is problematic. In the worst case, S/N over a set number of peak-widths can become infinite, but the LOD is clearly not infinite!
(3) Everyone: OK, OK, I'll happily concede that S/N is quite a good instant check for disasters in the system, and I'm no more keen than anyone on having to run 58 low-level standards and blanks before I get to my 3 samples, just to prove the system's working...
But for this application, who cares how it's defined? All we want is to know that the method today (in this lab) is not significantly worse than it was when it was validated (in this lab).